Reliability Wearout Mechanisms in Advanced CMOS Technologies

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Reliability Wearout Mechanisms in Advanced CMOS Technologies

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Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Price: R4 099,00
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R4 099,00
+ R732,99 Shipping

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Description

Reliability Wearout Mechanisms in Advanced CMOS Technologies

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology it assumes no reliability education or experience.
  • Brand: John Wiley & Sons Inc
  • Category: Computing & Internet
  • Format: Hardback
  • Language: English
  • Publication Date: 2023-03-22
  • Publisher / Label: John Wiley & Sons Inc
  • Author: Alvin W. Strong (IBM)
  • Number of Pages: 640
  • Fruugo ID: 434363568-911570901
  • ISBN: 9780471731726

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  • STANDARD: R732,99 - Delivery between Fri 12 December 2025–Thu 01 January 2026

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