Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy

R4 749,00
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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy

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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy

Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy

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Price: R4 749,00
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R4 749,00
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Description

Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy

Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
  • Brand: John Wiley & Sons Inc
  • Category: Science, Medicine & Nature
  • Format: Hardback
  • Language: English
  • Publication Date: 2023-05-02
  • Publisher / Label: John Wiley & Sons Inc
  • Author: Wai Kin Chim (National University of Singapore)
  • Number of Pages: 288
  • Fruugo ID: 434363592-911570923
  • ISBN: 9780471492405

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  • STANDARD: R428,99 - Delivery between Fri 16 January 2026–Thu 05 February 2026

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